Facilities at UGC-DAE CSR, Indore


UHV e-beam deposition (SRP)
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Magnetron Sputtering (SRP)
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Pulsed Laser Deposition (DMP/RJC)
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Laser MBE (RJC)
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Ion Beam Sputtering (MG)
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2-inch Target Magnetron Sputtering  (MG)
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3-inch Target High Power Impulse Magnetron Sputtering (MG)
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Langmuir Blodgett Deposition (VRR)
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Table-top coater (VRR)
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Chamber in PLD laboratory (VGS)
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Spin-Coating (VRR)
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UHV-Rapid Thermal Annealing (MG)
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High Vacuum Thermal Annealing (MG)
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Centrifuge (15krpm) (GSO)
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Vacuum drying oven (150 oC) (GSO)
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Probe Sonicator 750 W, 20 kHz (GSO)
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Water purification system Elix 3 (GSO)
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Electronic balance Citizen CX265 (GSO)
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Programmable tube furnace (1000 oC) (GSO)
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Box Furnace – 1700 C (RR)
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Tubular Furnace – 1250 C (RR)
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1Ion-milling TEM sample Preparation facility (NPL)+
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Carbolite Muffle furnace ( 1700 C) (NPL)
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Muffle furnace (SRB)
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High Temperaure Tubalar Furnace
1400 C (VGS)
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Microwave assisted hybrid high temperature (1400 C) furnace (VRR)
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Nabertherm Furnace (1500 C) (RJC)
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Box Furnace Max Temperature: 1700 C (AL)
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Furnace tubular 1200C (DK)
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Tube furnace (max. 900 C) (UPD)
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Mirror Image furnace for single crystal growth. (MPS)
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Arc Furnace (RR)
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Furnaces (up to 1600 C) (RR)
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CEM discover Microwave synthesizer (RV)
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Indfur made tubular furnace (1000O) (RV)
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Nebertherm made box furnace (1400O) (RV)
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Nebertherm made three zone furnace (RV)
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Indfur made box furnace (1000O) (RV)
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Fast Heating Electron Beam Vaccum Annealling  (0-1000C)
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Novocontrol Dielectric measurement setup (90-400K) (NPL)
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Angle resolved photoemission spectroscopy (SRB)
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X-ray photoelectron spectroscopy (SRB)
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Inverse photoemission spectroscopy (SRB)
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Raman Spectroscopy (VGS)
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Mössbauer spectrometer (VRR)
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P-E loop tracer & Dielectric (VRR)
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Secondary Ion Mass Spectroscopy (MG)
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UV-Vis (UPD)
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FTIR (UPD)
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XPS – SPECS System
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XPS – VSW (UPD)
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Piezoelectric coefficient (d33) and dielectric measurements (DKS)
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Dielectric and PE loop measurements (RR)
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Table-top XRD (DMP)
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Low-Temperature High-magnetic field XRD ( LTHM-XRD) (NPL)
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HRXRD (thin film XRD) (VRR)
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D8 Advance - Powder XRD (MG)
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SEM/EDAX (DMP)
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Transmission electron microscopy (TEM) (NPL)
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MOKE: magnetometer and microscopy (VRR)
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LTHM Scanning Probe microscope (RR)
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Veco make SPM scanning probe microscope (RV)
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Bruker made Bio-AFM (Bioscope resolve) (RV)
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Nanoscope E AFM from DI, USA (RV)
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Zeiss make Laser Confocal scanning optical microscope (RV)
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FEI made NOVA NANOSEM 450 FE-SEM (DMP/RV)
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Ac-Susceptibility Setup (RR)
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14-Tesla VSM (RR)
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7-Tesla SQUID Magnetometer (RR)
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16-Tesla VSM (RR)
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Home-fabricated Electrical resistivity and thermopower setups (5-330K) (GSO)
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Zeta potential-Nanoplus 3 (GSO)
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SQUID-VSM for Thin Films (RJC)
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Diff. Scan. Calorimeter (Mettler-Toledo) (RJC)
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Broadband Impedance Analyzer
(Novo-Control) (RJC)
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9T Magnet-Cryostat (Oxford NanoSystems) (MPS)
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P-E Loop Tracer (Radiant Technologies) (RJC)
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9T PPMS for Resistivity, magnetoresistance and Hall measurements (AL)
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16 T PPMS - For resistivity and magnetoresistance (DK)
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Home developed resistivity and thermopower measurements (DKS)
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Heat Capacity Measurement (100mK to 4.0K ; 0 to 16T (MPS)
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8-Tesla resistivity/ magnetoresistance and heat capacity (RR)
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16-Tesla magnet system (RR)
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Quantum design make Physical property measurement system (PPMS) (RV)
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Resistance Measurements (100mK to 4.0 K;  0 to 16T)  (MPS)
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AC Resistance Measurements (2K to 300K;  0 to 16T) (MPS)
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I-V Measurements (2K to 300K;  0 to 16T) (MPS)
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Resistance Measurements (2K to 300 K;  0 to 16T) (MPS)
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Heat Capacity Measurements (2K to 300K;  0 to 16T) (MPS)
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Depth profilometer (DMP)
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Mettler-Toledo AG Semi-Microbalance (RJC)
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Sample cutting machine (RR)
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Sample cutting machine using spark erosion (RR)
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Glove Box (RR)
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Ultrasonic sample cleaner (MG)
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